Muslim, Joko and Lesaint, Olivier and Hanna, Rachelle and Sinisuka, Ngapuli Irmea (2022) Breakdown Properties of Epoxy and Ceramic Substrates Embedded in Liquids at High Temperature. ICD 2022 - IEEE 2022 4th International Conference on Dielectrics, Proceedings. pp. 110-113.
Full text not available from this repository.Abstract
Surface breakdown is investigated with substrates made either from standard glass/epoxy PCB board or Alumina
ceramic, and embedded in silicone gel or dibenzyltoluene (DBT) high temperature liquid. Depending on the substrate nature and gap distance, breakdown may occur either above the surface within the encapsulant material, or below within the solid substrate. In the case of ceramic substrate with liquid encapsulation, which could be tentatively used at high temperatures above 200°C, the weakest material is the ceramic, which shows irreversible degradation (cracks) after a single breakdown. Therefore, such insulating structure does not benefit from the self-healing character of liquids. Breakdown voltages also show a marked decrease at high temperature
| Item Type: | Article |
|---|---|
| Additional Information: | Indonesia Endowment Fund for Education (LPDP) is gratefully acknowledged for the financial support to the first author, ARKEMA company for providing DBT samples, and Rogers company for providing alumina samples. |
| Uncontrolled Keywords: | Degradation, Temperature, Liquids, Electric breakdown, Solids, Ceramics, Dielectric liquids |
| Subjects: | Bidang Keilmuan > Distribusi Tenaga Listrik Bidang Keilmuan > Electrical Engineering Bidang Keilmuan > Electrical Isolation Bidang Keilmuan > Elektro Arus Kuat Bidang Keilmuan > Insulation Jurnal Bidang Keilmuan > Materials Science Bidang Keilmuan > Teknik Elektro Bidang Keilmuan > Transmisi Daya Listrik |
| Divisions: | Fakultas Ketenagalistrikan dan Energi Terbarukan > S1 Teknik Elektro |
| Depositing User: | Yudha Formanto |
| Date Deposited: | 02 Dec 2025 03:30 |
| Last Modified: | 02 Dec 2025 03:31 |
| URI: | https://repository.itpln.ac.id/id/eprint/4265 |
