Diantari, Retno Aita and Putri, Villaniea Fitri (2023) Analysis of the Effect of Loading on Age Loss and Efficiency on Dry Type Transformer at PT MRT Jakarta. ICPERE 2022 - 5th International Conference on Power Engineering and Renewable Energy, Proceedings.
Full text not available from this repository. (Request a copy)Abstract
Transformer is an electric devices and will experience a load which will affect the amount of life shrinkage and also the resulting efficiency. This study aims to analyze the magnitude of life shrinkage, analyze the effect of loading that occurs on dry transformers at the Senayan MRT station and Bundaran HI MRT station. This study has several methods of analysis by calculating the load ratio, temperature hotspot on the transformer, life shrinkage for 24 hours to % relative age loss, and the life of the transformer so that it can find the results of the remaining life of the transformer. Percentage of loading for the Senayan MRT station is between 18.44% and 19.96%, while the percentage of loading for the Bundaran HI MRT station has a higher yield between 32.49% and 34%, respectively. The result of age loss at Senayan MRT station is 0.069% with a remaining life for 15.5465 years. The result of age loss at the Bundaran HI MRT station is 0.15% for 15.5425 years. The efficiency of the result at the Bundaran HI MRT station with an average yield of 99.13%, and at the Senayan MRT station is 98.41%.
| Item Type: | Article |
|---|---|
| Additional Information: | Date of Conference: 22-23 November 2022 |
| Uncontrolled Keywords: | dry type transformer , load transformer , winding temperature , lifetime transformer |
| Subjects: | Bidang Keilmuan > Circuit Breaker Bidang Keilmuan > Electrical Engineering Bidang Keilmuan > Elektro Arus Kuat Jurnal Bidang Keilmuan > Transformer |
| Divisions: | Fakultas Ketenagalistrikan dan Energi Terbarukan > S1 Teknik Elektro |
| Depositing User: | Yudha Formanto |
| Date Deposited: | 10 Feb 2026 07:00 |
| Last Modified: | 10 Feb 2026 07:00 |
| URI: | https://repository.itpln.ac.id/id/eprint/4971 |
